简介
半导体行业发展迅速,技术的不断更新迭代,使得摩尔定律可以继续延续。技术研发在半导体行业具有重要意义,通过不断改进半导体材料、工艺和器件设计,可以提高芯片的性能,如速度、功耗、集成度等,从而推动整个电子产品的发展。
在技术研发阶段,需要进行大量电性参数测试,以此来反应器件、工艺是否符合要求。99905银河测试设备测试效率高、精度高,适用于各类应用场景,包括SPICE模型测试、可寻址测试和可靠性测试等,为半导体行业的技术研发提供了可靠支持。
半导体行业发展迅速,技术的不断更新迭代,使得摩尔定律可以继续延续。技术研发在半导体行业具有重要意义,通过不断改进半导体材料、工艺和器件设计,可以提高芯片的性能,如速度、功耗、集成度等,从而推动整个电子产品的发展。
在技术研发阶段,需要进行大量电性参数测试,以此来反应器件、工艺是否符合要求。99905银河测试设备测试效率高、精度高,适用于各类应用场景,包括SPICE模型测试、可寻址测试和可靠性测试等,为半导体行业的技术研发提供了可靠支持。
TD Tester | T4000 (48/100 pin)* |
Standard Resources | HR_SMU+HS_SMU (18~36) |
Pulse generator (2/4) | |
Signal analyzer (2) | |
Switch matrix | |
LCR Meter (1/2) | |
Number of measurement pins | 48/100 |
Voltage Coverage | ±200 V |
Current Coverage | ±1 A |
Voltage measure sensitivity | 100 nV |
Current measure sensitivity | 0.1fA |
Voltage measure accuracy | 100uV |
Current measurement accuracy | 0.1 pA |
Maximum SMU sample rate | 1.8M samples/sec |
Capacitance measurement accuracy | 10 fF |
RO Frequency Coverage | ~ 20MHZ |
Measurement Functions | DC Current / DC Voltage / Kelvin / Capacitance / Inductance AC Current / AC Voltage / Differential Voltage / Frequency Arbitrary Waveform / Clock Generation / Synchronization (triggering mode) / C-V scan |
Typical Supported Test Items |
Addressable (Transistor Array/ Yield Array/Ring Oscillator Array/CBCMOVCMDenseArrayHYDS) ID/VT/VTGM/IOFF/ISUB/BV/CAP//ICP |
BETA/VBE/BVCEO/BVCBO/BVEBO | |
R2/RKLV/LK/CAP_METAL | |
IREAD/ISTANDBY/IDDQ/WM/SNM | |
ERASE/PROGRAM | |
IDDA/IDDQ/FREQ | |
IDDA/IDDQ/FREQ | |
Mean time between failures (MTBF) | > 1000 hours |
Mean time to repair (MTTR) | < 6 hours |
Uptime rate | ~ 97% |
# Can select based on user needs
* Both T4000 and T4100S can support WLR test if upgrading software
This table shows recommend testers at different application, if you have other requirements, please contact us.